261. The gm/ID design methodology, a sizing tool for low-voltage analog CMOS circuits
پدیدآورنده : / by Paul G.A. Jespers
کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)
موضوع : Metal oxide semiconductors, Complementary--Design and construction,Low voltage integrated circuits--Design and construction,Linear integrated circuits--Design and construction
رده :
TK
,
7871
.
99
,.
M44
,
J47
,
2010
262. Understanding smart sensors /
پدیدآورنده : Randy Frank.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Application-specific integrated circuits.,Detectors-- Design and construction.,Programmable controllers.,Semiconductors.,Signal processing-- Digital techniques.,Application-specific integrated circuits.,Detectors-- Design and construction.,Programmable controllers.,Semiconductors.,Signal processing-- Digital techniques.,TECHNOLOGY & ENGINEERING-- Technical & Manufacturing Industries & Trades.
رده :
TA165
.
F724
2013eb
263. Understanding smart sensors
پدیدآورنده : Frank, Randy.
موضوع : ، Detectors-- Design and construction,، Programmable controllers,، Signal processing-- Digital techniques,، Semiconductors,، Application specific integrated circuits
۲ نسخه از این کتاب در ۱ کتابخانه موجود است.
264. Understanding smart sensors /
پدیدآورنده : Randy Frank.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Application-specific integrated circuits.,Detectors-- Design and construction.,Programmable controllers.,Semiconductors.,Signal processing-- Digital techniques.,Application-specific integrated circuits.,Detectors-- Design and construction.,Programmable controllers.,Semiconductors.,Signal processing-- Digital techniques.,TECHNOLOGY & ENGINEERING-- Sensors.
رده :
TA165
.
F724
2000eb
265. X-ray metrology in semiconductor manufacturing
پدیدآورنده : Bowen, D. Keith )David Keith(
موضوع : ، Semiconductors-- Design and construction Quality control,، Integrated circuits-- Measurement,، Semiconductor wafers-- Inspection,، X-rays-- Diffraction,، Fluroscopy
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
266. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors--Design and construction--Quality control,Integrated circuits--Measurement,Semiconductor wafers--Inspection,X-rays--Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
267. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
موضوع : Semiconductors- Design and construction- Quality control,Integrated circuits- Measurement,Semiconductor wafers- Inspection,X-rays- Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
268. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy
رده :
E-BOOK
269. transistor device and circuit design-electron-Hybrid CMOS single
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Metal oxide semiconductors, Complementary. ; Integrated circuits ; Design and construction. ;
270. voltage analog CMOS circuits-The gm/ID methodology, a sizing tool for low
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Metal oxide semiconductors, Complementary ; Design and construction. ; Low voltage integrated circuits ; Design and construction. ; Linear integrated circuits ; Design and construction. ;
